Circular BIST with state skipping
نویسندگان
چکیده
منابع مشابه
Circular BIST with state skipping
Circular built-in self-test (BIST) is a “test per clock” scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion. However, it has seen limited use because it does not reliably provide high fault coverage. This paper presents a systematic approach for achieving high fault coverage with circular BIST. Th...
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Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has seen limited use because it does not reliably provide high fault coverage. This paper presents a systematic approach for achieving high fault coverage with circular BIST. The basic idea is to add a small amount of logic ...
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A BIST (Built-In Self-Test) methodology that uses the circular BIST technique to perform a random test of sequential logic circuits is presented. The fault coverage obtained using this technique is supplemented by deterministic tests that are presented to the CUT (Circuit Under Test) by configuring the circular path as a partial scan chain. A CAD (Computer-Aided Design) tool for automating this...
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ژورنال
عنوان ژورنال: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
سال: 2002
ISSN: 1063-8210,1557-9999
DOI: 10.1109/tvlsi.2002.801564